Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Linear Power Supplies Precision, GPIB or Local Control, Ultra Low Ripple/Noise
Series ATE-DMG
Kepco's 1000 watt instrument-grade digital power supplies, Series ATE-DMG, are linear low-noise power supplies designed to respond very quickly and precisely to voltage and current setting instructions delivered interactively by the GPIB (IEEE 488.2) or from a front panel keypad. When programmed from the bus, the ATE-DMG power supplies respond to the SCPI (Standard Commands for Programmable Instruments) common language for instruments used in an automatic test system.
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Memory Test System
T5851/T5851ES
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Pressure Comparator (System E)
P014
AMETEK Sensors, Test & Calibration
The P014 hydraulic jack pump (System E) is an extremely effective pressure pump designed for easy, controlled, high pressure generation. Each comparator includes a 4 connection manifold, which can be used for the reference indicator, the device under test, a fine adjust, an isolation valve, or a fluid reservoir. The adjustable reference pressure port lets you set your reference gauge at the best viewing angle.
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Test System
MxDSRC™
The MxDSRC Test System simulates systems in the vehicle that interact with the DSRC radio module to create tests closely replicating real-world scenarios. Its integrated approach allows the DSRC components, such as RF quality and protocol conformance, to be exercised with multiple system components. MxDSRC provides a powerful and easy-to-use framework for testing your DSRC system.
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Motion Simulator For Test Systems
Metis
METIS is a motion simulator for sensor and end system level testing. Configurable design allows you to create system you need! - 1-axis rate table for gyro testing - 2-axis unit for 6DOF accelerometer and gyroscope testing - 3-axis Gimbal system for simultaneus Yaw, Pitch and Roll stimulus.
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Commercial Test Systems
IR Target Projectors, IR/Visible Target Projections, Wide FOV Target Projectors, Focal Plane Array Tester, Fused IR/Visible Projectors, High Volume Tester, IR/Visible Ranging Projectors, Dual Blackbody Wide FOV, Future Test Requirements.
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ThermalAir Desktop Series Temperature Forcing System
ThermalAir TA-1000A Desktop System
The ThermalAir TA-1000 high capacity thermal air stream system is used for temperature testing, fast thermal cycling, and device temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature from -25°C to +200°C.
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Lighting Technology LED Solutions
Our OTP² system platform provides the basis for reliable tests of products equipped with single or multiple LEDs. Optical measurement values like color and intensity can be recognized reliably by the integrated LED analyzers. Depending on the application, it is also possible to employ camera systems for the optical evaluation of LEDs.
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PXI Source Switching Module
40-618-001
The 40-618 PXI Source Switching Module consists of 12 separate 4-channel multiplexers and 44 uncommitted SPST relay contacts in a single width PXI module. Typical applications include signal routing for avionics test systems that conform to the ARINC 608A specification.
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SSD Test Systems
MPT3000ES / MPT3000ES2
Using the same high-performance electronics and powerful software as all products in the MPT3000 family, the MPT3000ES and MPT3000ES2 engineering stations feature a small footprint configured to test up to eight SSDs in parallel. The system's small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.
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2Mbit/E1 Error Rate Tester
CA6037
CA6037 is a hand-held equipment designed for 2M bit erroe rate test, applicable to telecommunication access networks, transmission networks and the start-up, check and maintenance of optical communications systems.
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X-Ray Inspection
X-ray inspection systems are used wherever defects need to be detected by non-destructive means. The spectrum of use is broad and ranges from quality controls for complex assemblies, to the testing of materials for cracks and air inclusions, to foreign matter inclusions and shape deviations. The trend toward miniaturization, higher packing densities, and the relocation of components to the interior of the assembly require precise X-ray inspections that detect hidden defects quickly and reliably....show more -
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Electro-Optical System Test Bench
IRCOL
Optical collimators and universal electro-optical test benches.
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Rubidium/GPS Frequency Standard
PXIe-3352
The Astronics Test Systems PXIe-3352 frequency standard module sets a new standard for high density functionality in a PXI module by combining a Rubidium oscillator with a GPS receiver into a single, compact instrument.
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Optics Test Systems
MTF Measuring Device For Endoscopes
Optik Elektronik Gerätetechnik GmbH
Manual MTF measuring device for endoscopes. The measurement setup is based on modular individual components that can be arranged on a breadboard according to the type of endoscope (angle between light entrance and eyepiece).
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Non-contact Ultrasonic Testing System
Yamaha Fine Technologies Co., Ltd.
Contact-free inspection through ultrasonic transmission detecting air bubbles, separation, and foreign materials inside workpieces. With a Yamaha ultrasonic amplifier installed, contact-less inspection in the air is realized. Without damaging or wetting the workpiece, it is possible to inspect the workpiece for packing defects, air bubbles, and even flaw depth.
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AC Engine Dynamometers
AC dynamometers (dynos) provide accurate and repeatable dynamometer control under stringent operating conditions for various testing applications. Whether testing small electric tools, large electric motors, off-road diesel engines, marine diesel engines or powertrain components, we have a system that’s right for you.
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System Test
Testing a complete system is very different from unit and integration test. It starts with the V model that defines the system requirements, and this needs an effective system test capability that includes both the system and the environment around it. If the system has interfaces to the outside world, communications links or human control, these interfaces have to be tested.
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Battery Management Systems Testing
A Battery Management System (BMS) is an embedded unit performing critical battery functions, including cell monitoring and balancing, pack charge and discharge control, safety, and communications. The BMS must be tested early in development to optimize control algorithms, as well as during manufacturing to ensure reliable functionality. Bloomy’s family of BMS test systems provides a consistent platform for engineers to bring a BMS to market faster, and more reliably.
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SAE AS4111/4112 Protocol Validation Software
AltaRTVal
AltaRTVal provides the most advanced MIL-STD-1553 COTS protocol validation tool in the industry, and helps prepare for Test Systems Inc Full SAE 4111 Validation. The software implements protocol tests for both the SAE AS4111 RT Validation Test Plan and the SAE AS4112 RT Production Test Plan. Ideal for testing new software revisions of current designs or manufacturing production units.
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DC Hi-Pot Tester
3010HP, 3025HP & 3050HP
The DC Hi-Pot test is an important part and parcel of the electrical safety tests mandated by standards organization world-wide. More than 80 per cent of faults in electrical and electronic systems are due to weak insulation caused by environmental factors such as dirt, grease, temperature stress, humidity, etc that affect the dielectric strength of the insulation material.
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Mid Bus Probes
MBP850
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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PXI Resistor Module 4-Channel 1R to 127R
40-293-012
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Test Automation Solution
CONFORMIQ TRANSFORMER
Conformiq Transformer shortens the path to test automation, simplifies model-based testing (MBT) adoption using existing methods, and automates manual test execution. Along with Conformiq Creator, which generates executable test cases, scripts and documentation from models, it automates and transforms test design, extending the Conformiq 360° Test Automation™ solution for complex system testing at the speed of development.
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Data Acquisition Systems & Data Loggers
Whether it’s in a vehicle, on a test stand or monitoring equipment and machinery - imc data acquisition systems are easy to operate and will help you become more productive and profitable. Our products are suited for work in mechanical and mechatronic applications. They handle up to 100 kHz per channel, are compatible with almost all signal sources and sensors, and can measure nearly all physical quantities such as pressure, force, speed, vibration, noise, temperature, voltage and current. The spectrum of imc data acquisition systems ranges from simple data acquisition via integrated real-time calculations, to the integration of models and complete automation of test stands.
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ACCUplace Position Grid
AP-P Series
The AP-P is a unique calibration target that is designed to test the position and/or recognition ability of a vision system. The matrix of small scales, precisely positioned in a grid matrix format, makes testing for subject recognition and system positioning simple.The overall target is comprised of a matrix consisting of 6.0mm x 6.0mm square individual components each having a 5.0mm x 5.0mm X & Y Scale with 0.100 divisions. The scale has pitch accuracy of 1μm. The AP-P is available on two standard materials; Chrome on Glass (CG) and Chrome on Opal (OP).
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High Speed Spin Fixture
1571P Series
The Model 1571 High Speed Rate Table System is designed to provide a precision high velocity testing solution for the development and/or production testing of inertial packages or their components.
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FMET Systems
The Failure Mode and Effect Testing system allows the shorting of any I/O pin to any other I/O pin, including one of 4 common "Rails". Users can establish rules to prevent unwanted shorting conditions.
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Dynamic Ultra Micro Hardness Tester
DUH-210/DUH-210S
A new evaluation system for measuring the material strength of micro regions, such as semiconductors, LSI, ceramics, hard disks, vapor deposited films, and thin coating layers, not addressed by previous hardness testers. It can also be used to evaluate the hardness of plastics and rubbers. This instrument uniquely measures dynamic indentation depth, not the indentation after the test. This in turn permits measurement of very thin films and surface (treatment) layers that are impossible to measure with conventional methods. Additionally, this same method supplies the data needed to calculate elastic modulus on the test specimens.
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ETL Testing
Data is of utmost importance in digital systems. Protecting data, therefore, is of utmost importance. ETL refers to Extract, Transform, and Load. It supports the movement of data from its source to storage. With ETL testing we ensure that the data is not lost or corrupted during this movement. Huge volumes of data are collected in various formats and sources. The mapping process of these data is error-prone and can have quality issues.
